[ALMF & CBA] Essentials I – Essentials of Widefield-Microscopy

almf   2023-01-16   Comments Off on [ALMF & CBA] Essentials I – Essentials of Widefield-Microscopy

Date(s) - 2023-01-16 - 2023-01-30
10:00 CET - 17:00 CET

Essentials I – Essentials of Widefield-Microscopy

Organizer: Stefan Terjung, Beate Neumann, Marko Lampe, Manuel Gunkel and Christian Tischer

Registration for EMBL staff only

The course is a beginners course with focus on teaching the essential knowledge needed to conduct a widefield microscopy-based experiment, to generate reliable data and to inspect and handle the acquired images. It will take place as a two day event and consists of a practical session on January 16th (10 am – 5 pm) in the ALMF and an image handling and inspection session on Wednesday January 30th (2 – 5 pm) together with CBA.
Knowledge of this course will be the basis for the Essentials in Microscopy II (Confocal Microscopy) course.

For preparation of the course you will get a short list of videos covering the basics as well as a self-test questionaire

Topics covered include

  • Transmission light path and K√∂hler illumination

  • Fluorescence microscopy, filters and how to find good filter fluorophore combinations

  • Light sources, Microscope objectives (magnification, resolution and brightness), Cover slips

  • exposure time, bit depth and LUT, background level, remarks on sample preparation

Data handling and ispection topics:

    Using ImageJ, we will cover the following topics related to 3D image data:

  • Opening images
  • Image content and inspection
  • Image calibration
  • Image data types
  • Image file formats


This event is fully booked.