Course: Basic Image Handling and Inspection

Christian Tischer   2018-02-22   Comments Off on Course: Basic Image Handling and Inspection

Date/Time
Date(s) - 2018-02-22
09:30 CET - 12:00 CET

Location
13-518

Categories


Using ImageJ, we will cover the following topics:
– Opening images
– Image visualization
– Image gray value inspection
– Important image properties:
– Bit depth, dynamic range, signal to noise, etc.
– Bit depth conversions
– Saving an image

Registration

This half day course is part of the ALMF Basics in Light Microscopy Course. If you are registered for the microscopy course you are automatically registered for the image analysis as well. You can however also only register for the image analysis part. In any case, for registration please send an e-mail to ALMF

Event details

Dear Course Participants,

On Thursday 22 Feb we will meet 9:30 – 12:30 in room 13-518 for a practical session on image data handling and inspection. Please note that this is not a full image analysis course. If you are interested in image analysis (such as measuring numbers in images and advanced object segmentation) please consider registering for this course.

For Thursday, please

1. Bring your own laptop
2. Install Fiji on your laptop:
3. Please download and unzip these files:

During the course on Thursday morning we will do below practical sessions together. We recommend that you print them out on paper such that you can write into it while listening.

inspection-of-the-numerical-content-of-images
image-presentation
image-bit-depths
image-format-conversion
image-segmentation
the-signal-to-noise-ratio